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In the field or at the factory
Portability, ease of use, fast measurements, the stuff demanded by operations in field service and repair are second nature to the dScope Series III digital/analog audio analyzer. It's the world's only analyzer that answers all these demands in one affordable, compact instrument. It's the Swiss army knife of audio test instruments and when it's all said and done complete proof of performance documentation authenticating your work is just a click away.

Tracking down intermittent faults
Have you ever had to track down a troublesome intermittent fault before you can undertake a repair? No problem! Prism Sound's measurement instruments include powerful 'Event Manager' features to watch over your equipment for you so you don't have to - and these tools are not found anywhere else. The Event Manager allows you to track down any kind of intermittent audio fault imaginable, whether it be the occasional pop or glitch in a digital audio system, premature thermal compression in a power amplifier, drift in the digital frame rate of an AES3 source, occasional muting in a Blu-ray disc player... you name it, we can solve it.

Simply set up the event manager to monitor your analysis results, and every single fault will be recorded in a log file over arbitrary time periods until you say stop. The event log file comes complete with the time and date stamp, the nature of the fault, and the measurement result recorded, for every failure logged during the test. You want more? Well, you can choose to fire automation scripts on detection of intermittent faults - record a snapshot of the waveform and FFT before and after the event; initiate an automatic series of debug tests; have an email sent automatically to your service department reporting the fault; fire off an audible tone to alert you to the fault... No other test system comes close to saving you as much time and hassle when it comes to tracking down intermittent faults!
 
     
   
  dScope Series III screenshot showing the Event Manager logging
intermittent failures on multiple parameters simultaneously